The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 2021

Filed:

Oct. 18, 2019
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Yusaku Hashimoto, Koshi, JP;

Takeshi Shimoaoki, Koshi, JP;

Masahiro Fukuda, Koshi, JP;

Kouichirou Tanaka, Koshi, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03F 7/30 (2006.01); G03F 7/16 (2006.01); B05D 1/00 (2006.01); B05D 1/40 (2006.01); B05D 1/26 (2006.01);
U.S. Cl.
CPC ...
G03F 7/3021 (2013.01); B05D 1/002 (2013.01); B05D 1/40 (2013.01); G03F 7/162 (2013.01); B05D 1/26 (2013.01);
Abstract

A method includes forming a liquid puddle of a mixed solution of the diluting liquid and the processing liquid; rotating the substrate at a first rotation speed which allows the mixed solution located at a region facing an inner side than an edge of the liquid contact surface to stay between the liquid contact surface and the surface of the substrate and allows the mixed solution located at a region facing an outer side than the edge of the liquid contact surface to be diffused toward an edge of the substrate; rotating the substrate at a second rotation speed smaller than the first rotation speed after the substrate is rotated at the first rotation speed; and moving the nozzle toward the edge of the substrate while discharging the processing liquid from the discharge hole in a state that the substrate is rotated at the second rotation speed.


Find Patent Forward Citations

Hashimoto, Yusaku. (2021). Substrate processing method and recording medium capable of suppressing non-uniformity in degree of progression of processing depending on position on substrate (U.S. Patent No. 11079679). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11079679

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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