The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 22, 2021

Filed:

Oct. 03, 2017
Applicant:

Cabot Microelectronics Corporation, Aurora, IL (US);

Inventors:

Ji Cui, Aurora, IL (US);

Helin Huang, Aurora, IL (US);

Kevin P. Dockery, Aurora, IL (US);

Pankaj K. Singh, Plainfield, IL (US);

Hung-Tsung Huang, Tainan, TW;

Chih-Hsien Chien, Kaohsiung, TW;

Assignee:

CMC Materials, Inc., Aurora, IL (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C09G 1/02 (2006.01); H01L 21/768 (2006.01); H01L 21/321 (2006.01); H01L 21/3105 (2006.01); G09G 1/02 (2006.01);
U.S. Cl.
CPC ...
G09G 1/02 (2013.01); H01L 21/31053 (2013.01); H01L 21/3212 (2013.01); H01L 21/7684 (2013.01);
Abstract

The invention provides a chemical-mechanical polishing composition comprising (a) an abrasive selected from the group consisting of alumina, ceria, titania, zirconia, and combinations thereof, wherein the abrasive is surface-coated with a copolymer comprising a combination of sulfonic acid monomeric units and carboxylic acid monomeric units a combination of sulfonic acid monomeric units and phosphonic acid monomeric units, (b) an oxidizing agent, and (c) water, wherein the polishing composition has a pH of about 2 to about 5. The invention further provides a method of chemically-mechanically polishing a substrate with the inventive chemical-mechanical polishing composition. Typically, the substrate comprises tungsten or cobalt and silicon oxide.


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