The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 16, 2021

Filed:

Jun. 22, 2020
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

Hongfa Luan, Baoshan, TW;

Yi-Fan Chen, New Taipei, TW;

Chun-Yen Peng, Hsinchu, TW;

Cheng-Po Chau, Tainan, TW;

Wen-Yu Ku, Hsinchu, TW;

Huicheng Chang, Tainan, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/28 (2006.01); H01L 29/78 (2006.01); H01L 29/66 (2006.01); H01L 21/225 (2006.01); H01L 29/51 (2006.01); H01L 21/306 (2006.01); H01L 21/3105 (2006.01); H01L 21/8234 (2006.01); H01L 29/08 (2006.01); H01L 29/40 (2006.01); H01L 29/423 (2006.01); H01L 29/417 (2006.01);
U.S. Cl.
CPC ...
H01L 21/28185 (2013.01); H01L 21/2254 (2013.01); H01L 21/28176 (2013.01); H01L 21/30604 (2013.01); H01L 21/31053 (2013.01); H01L 21/823418 (2013.01); H01L 21/823431 (2013.01); H01L 21/823437 (2013.01); H01L 21/823462 (2013.01); H01L 21/823468 (2013.01); H01L 29/0847 (2013.01); H01L 29/401 (2013.01); H01L 29/42364 (2013.01); H01L 29/517 (2013.01); H01L 29/66477 (2013.01); H01L 29/66545 (2013.01); H01L 29/66636 (2013.01); H01L 29/66795 (2013.01); H01L 29/785 (2013.01); H01L 29/7851 (2013.01); H01L 29/41791 (2013.01); H01L 29/513 (2013.01);
Abstract

Embodiment described herein provide a thermal treatment process following a high-pressure anneal process to keep hydrogen at an interface between a channel region and a gate dielectric layer in a field effect transistor while removing hydrogen from the bulk portion of the gate dielectric layer. The thermal treatment process can reduce the amount of threshold voltage shift caused by a high-pressure anneal. The high-pressure anneal and the thermal treatment process may be performed any time after formation of the gate dielectric layer, thus, causing no disruption to the existing process flow.


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