The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2020

Filed:

May. 09, 2019
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventors:

Chih-Chang Hung, Hsinchu, TW;

Chia-Jen Chen, Chiaya, TW;

Ming-Ching Chang, Hsinchu, TW;

Shu-Yuan Ku, Zhubei, TW;

Yi-Hsuan Hsiao, Taipei, TW;

I-Wei Yang, Yilan County, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/088 (2006.01); H01L 29/08 (2006.01); H01L 29/66 (2006.01); H01L 29/423 (2006.01); H01L 29/06 (2006.01); H01L 21/8234 (2006.01); H01L 21/3213 (2006.01); H01L 21/311 (2006.01); H01L 29/49 (2006.01); H01L 21/62 (2006.01); H01L 21/762 (2006.01); H01L 21/283 (2006.01); H01L 29/78 (2006.01); H01L 21/02 (2006.01); H01L 21/3105 (2006.01); H01L 21/321 (2006.01);
U.S. Cl.
CPC ...
H01L 27/0886 (2013.01); H01L 21/283 (2013.01); H01L 21/31116 (2013.01); H01L 21/32136 (2013.01); H01L 21/76224 (2013.01); H01L 21/823431 (2013.01); H01L 21/823437 (2013.01); H01L 21/823481 (2013.01); H01L 29/0649 (2013.01); H01L 29/0847 (2013.01); H01L 29/42376 (2013.01); H01L 29/49 (2013.01); H01L 29/4991 (2013.01); H01L 29/66545 (2013.01); H01L 29/66636 (2013.01); H01L 29/78 (2013.01); H01L 21/02068 (2013.01); H01L 21/31053 (2013.01); H01L 21/31144 (2013.01); H01L 21/3212 (2013.01); H01L 21/32139 (2013.01); H01L 29/6656 (2013.01);
Abstract

Methods of cutting gate structures, and structures formed, are described. In an embodiment, a structure includes first and second gate structures over an active area, and a gate cut-fill structure. The first and second gate structures extend parallel. The active area includes a source/drain region disposed laterally between the first and second gate structures. The gate cut-fill structure has first and second primary portions and an intermediate portion. The first and second primary portions abut the first and second gate structures, respectively. The intermediate portion extends laterally between the first and second primary portions. First and second widths of the first and second primary portions along longitudinal midlines of the first and second gate structures, respectively, are each greater than a third width of the intermediate portion midway between the first and second gate structures and parallel to the longitudinal midline of the first gate structure.


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