The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2020

Filed:

May. 07, 2019
Applicant:

Yangtze Memory Technologies Co., Ltd., Wuhan, Hubei Province, CN;

Inventors:

Haibo Li, Wuhan, CN;

Chao Zhang, Wuhan, CN;

Yanxia Lin, Wuhan, CN;

Assignee:

Yangtze Memory Technologies Co., Ltd., Wuhan, Hubei Province, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/34 (2006.01); G11C 16/24 (2006.01); G11C 16/10 (2006.01); G11C 16/04 (2006.01);
U.S. Cl.
CPC ...
G11C 16/3459 (2013.01); G11C 16/10 (2013.01); G11C 16/24 (2013.01); G11C 16/0483 (2013.01);
Abstract

Programming in a non-volatile memory device includes applying at least one programming pulse to a non-volatile memory cell during a first programming loop; applying at least one programming pulse to the non-volatile memory cell during a second programming loop succeeding the first programming loop; and providing a bitline bias voltage of the non-volatile memory cell according to a result of comparing a threshold voltage of the non-volatile memory cell in the first programming loop with a low verify level and/or a high verify level of a target data state of the non-volatile memory cell and a result of comparing a threshold voltage of the non-volatile memory cell in the second programming loop with the low verify level and/or the high verify level of the target data state of the non-volatile memory cell.


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