The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2020

Filed:

Oct. 29, 2018
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventors:

Yu-Chang Lin, Hsinchu, TW;

Chun-Feng Nieh, Hsinchu, TW;

Huicheng Chang, Tainan, TW;

Wei-Ting Chien, Hsinchu, TW;

Chih-Pin Tsao, Zhubei, TW;

Hou-Ju Li, Hsinchu, TW;

Tien-Shun Chang, New Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/66 (2006.01); H01L 21/8238 (2006.01); H01L 29/78 (2006.01); H01L 27/092 (2006.01); H01L 21/225 (2006.01); H01L 21/324 (2006.01); H01L 29/08 (2006.01);
U.S. Cl.
CPC ...
H01L 29/66803 (2013.01); H01L 21/2254 (2013.01); H01L 21/324 (2013.01); H01L 21/823821 (2013.01); H01L 27/0924 (2013.01); H01L 29/0847 (2013.01); H01L 29/66492 (2013.01); H01L 29/66545 (2013.01); H01L 29/66636 (2013.01); H01L 29/785 (2013.01); H01L 29/7833 (2013.01); H01L 29/7851 (2013.01);
Abstract

A finFET device and methods of forming a finFET device are provided. The method includes depositing a dummy gate over and along sidewalls of a fin extending upwards from a semiconductor substrate, forming a first gate spacer along a sidewall of the dummy gate, and plasma-doping the first gate spacer with carbon to form a carbon-doped gate spacer. The method further includes forming a source/drain region adjacent a channel region of the fin and diffusing carbon from the carbon-doped gate spacer into a first region of the fin to provide a first carbon-doped region. The first carbon-doped region is disposed between at least a portion of the source/drain region and the channel region of the fin.


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