The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2020

Filed:

Nov. 30, 2018
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventors:

Chih-Chien Chi, Hsinchu, TW;

Pei-Hsuan Lee, Taipei, TW;

Hung-Wen Su, Jhubei, TW;

Hsiao-Kuan Wei, Longtan Township, TW;

Jui-Fen Chien, Taichung, TW;

Hsin-Yun Hsu, Taoyuan, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/02 (2006.01); H01L 21/20 (2006.01); H01L 29/66 (2006.01); H01L 21/762 (2006.01); H01L 29/49 (2006.01); H01L 29/423 (2006.01); H01L 21/28 (2006.01); H01L 27/092 (2006.01); H01L 21/324 (2006.01); H01L 29/78 (2006.01); H01L 21/3205 (2006.01); H01L 29/417 (2006.01); H01L 21/3105 (2006.01); H01L 21/768 (2006.01);
U.S. Cl.
CPC ...
H01L 21/02362 (2013.01); H01L 21/02639 (2013.01); H01L 21/2018 (2013.01); H01L 21/28088 (2013.01); H01L 21/28194 (2013.01); H01L 21/3105 (2013.01); H01L 21/3245 (2013.01); H01L 21/32051 (2013.01); H01L 21/768 (2013.01); H01L 21/76262 (2013.01); H01L 27/0924 (2013.01); H01L 29/41791 (2013.01); H01L 29/4238 (2013.01); H01L 29/4975 (2013.01); H01L 29/66545 (2013.01); H01L 29/66636 (2013.01); H01L 29/66795 (2013.01); H01L 29/785 (2013.01); H01L 21/76224 (2013.01);
Abstract

Embodiments disclosed herein relate generally to capping processes and structures formed thereby. In an embodiment, a conductive feature, formed in a dielectric layer, has a metallic surface, and the dielectric layer has a dielectric surface. The dielectric surface is modified to be hydrophobic by performing a surface modification treatment. After modifying the dielectric surface, a capping layer is formed on the metallic surface by performing a selective deposition process. In another embodiment, a surface of a gate structure is exposed through a dielectric layer. A capping layer is formed on the surface of the gate structure by performing a selective deposition process.


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