The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2020

Filed:

Feb. 07, 2019
Applicant:

Mitsubishi Chemical Corporation, Tokyo, JP;

Inventors:

Yutaka Mikawa, Tokyo, JP;

Hideo Fujisawa, Tokyo, JP;

Tae Mochizuki, Tokyo, JP;

Hideo Namita, Tokyo, JP;

Shinichiro Kawabata, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/02 (2006.01); C30B 29/40 (2006.01); C30B 33/06 (2006.01); C30B 29/38 (2006.01); C30B 7/10 (2006.01);
U.S. Cl.
CPC ...
H01L 21/02389 (2013.01); C30B 7/10 (2013.01); C30B 7/105 (2013.01); C30B 29/38 (2013.01); C30B 29/406 (2013.01); C30B 33/06 (2013.01); H01L 21/0254 (2013.01); H01L 21/0262 (2013.01); H01L 21/02433 (2013.01); H01L 21/02609 (2013.01); H01L 21/02639 (2013.01); H01L 21/02642 (2013.01); H01L 21/02645 (2013.01); H01L 21/02647 (2013.01);
Abstract

A method for growing a GaN crystal suitable as a material of GaN substrates including C-plane GaN substrates includes: a first step of preparing a GaN seed having a nitrogen polar surface; a second step of arranging a pattern mask on the nitrogen polar surface of the GaN seed, the pattern mask being provided with a periodical opening pattern comprising linear openings and including intersections, the pattern mask being arranged such that longitudinal directions of at least part of the linear openings are within ±3° from a direction of an intersection line between the nitrogen polar surface and an M-plane; and a third step of ammonothermally growing a GaN crystal through the pattern mask such that a gap is formed between the GaN crystal and the pattern mask.


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