The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2020

Filed:

Jan. 23, 2018
Applicant:

Ebara Corporation, Tokyo, JP;

Inventors:

Mizuki Nagai, Tokyo, JP;

Kazuhito Tsuji, Tokyo, JP;

Takashi Kishi, Tokyo, JP;

Toshiki Miyakawa, Tokyo, JP;

Masashi Shimoyama, Tokyo, JP;

Jumpei Fujikata, Tokyo, JP;

Assignee:

EBARA CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C25D 17/08 (2006.01); H01L 21/687 (2006.01); C25D 21/12 (2006.01); C25D 17/00 (2006.01); H01L 21/67 (2006.01); C25D 17/06 (2006.01);
U.S. Cl.
CPC ...
C25D 17/08 (2013.01); C25D 17/001 (2013.01); C25D 17/005 (2013.01); C25D 17/06 (2013.01); C25D 21/12 (2013.01); H01L 21/6723 (2013.01); H01L 21/68785 (2013.01); C25D 17/00 (2013.01); C25D 17/004 (2013.01);
Abstract

A resistance measuring module for measuring electric resistance of a substrate holder is provided. The substrate holder has an electric contact configured to feed a current to a held substrate and contactable with the substrate. The substrate holder is able to hold a testing substrate for measurement of electric resistance of the substrate holder, and is configured such that the electric contact comes into contact with the testing substrate in a state where the testing substrate is held. The resistance measuring module includes: a test probe contactable with the testing substrate held in the substrate holder; and a resistance measuring instrument for measurement of a resistance value between the electric contact and the probe via the testing substrate.


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