The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2020

Filed:

Jan. 18, 2018
Applicants:

United Microelectronics Corp., Hsin-Chu, TW;

Fujian Jinhua Integrated Circuit Co., Ltd., Quanzhou, Fujian Province, CN;

Inventors:

Chia-Wei Wu, Taichung, TW;

Ting-Pang Chung, Taichung, TW;

Tien-Chen Chan, Tainan, TW;

Shu-Yen Chan, Changhua County, TW;

Assignees:

UNITED MICROELECTRONICS CORP., Hsin-Chu, TW;

Fujian Jinhua Integrated Circuit Co., Ltd., Quanzhou, Fujian Province, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/423 (2006.01); H01L 27/108 (2006.01); H01L 27/12 (2006.01); H01L 21/02 (2006.01); H01L 29/49 (2006.01); H01L 29/08 (2006.01); H01L 29/06 (2006.01); H01L 27/11568 (2017.01); H01L 27/11578 (2017.01);
U.S. Cl.
CPC ...
H01L 29/4236 (2013.01); H01L 21/02233 (2013.01); H01L 21/02244 (2013.01); H01L 21/02255 (2013.01); H01L 27/108 (2013.01); H01L 27/10823 (2013.01); H01L 27/10876 (2013.01); H01L 27/10885 (2013.01); H01L 27/10891 (2013.01); H01L 27/12 (2013.01); H01L 29/0649 (2013.01); H01L 29/0847 (2013.01); H01L 29/4238 (2013.01); H01L 29/4908 (2013.01);
Abstract

A semiconductor device and a method of forming the same are disclosed. First, a substrate having a main surface is provided. At least a trench is formed in the substrate. A barrier layer is formed in the trench and a conductive material is formed on the barrier layer and filling up the trench. The barrier layer and the conductive material are then recessed to be lower than the upper surface of the substrate. After that, an oxidation process is performed to oxidize the barrier layer and the conductive material thereby forming an insulating layer.


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