The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2020
Filed:
May. 17, 2016
Sap SE, Walldorf, DE;
Shane Bracher, Morningside, AU;
Daniel Ricketts, Toowong, AU;
Asadul Islam, Coorparoo, AU;
Liam Mischewski, Brisbane, AU;
Mark Holmes, Brisbane, AU;
Xiaohua Cao, Shanyin, CN;
Glenn Neuber, Red Hill, AU;
Karsten Ploesser, Bulomba, AU;
Hoyoung Jeung, Tennyson, KR;
SAP SE, Walldorf, DE;
Abstract
Implementations are directed to identifying potential churn of a user of one or more computer-implemented systems provided by an enterprise. In some examples, actions include identifying potential churn of providing a plurality of event profiles based on historical data, each event profile being representative of interactions of users with the enterprise and corresponding to churn of the users, at least one event profile being representative of an interaction of users with the one or more computer-implemented services, providing a pulse of the user at least partially based on historical data associated with the user, and one or more event profiles of the plurality of event profiles, and determining that the user is at-risk of churn based on the pulse of the user and a risk index value, and in response, displaying an indication that the user is at-risk of churn in a graphical user interface.