The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2020

Filed:

Jun. 22, 2018
Applicant:

Maxpower Semiconductor Inc., San Jose, CA (US);

Inventors:

Richard A. Blanchard, Los Altos, CA (US);

Mohamed N. Darwish, Campbell, CA (US);

Jun Zeng, Torrance, CA (US);

Assignee:

MaxPower Semiconductor Inc., San Jose, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/06 (2006.01); H01L 29/861 (2006.01); H01L 29/40 (2006.01); H01L 29/66 (2006.01); H01L 21/265 (2006.01); H01L 29/04 (2006.01); H01L 29/16 (2006.01); H01L 29/417 (2006.01);
U.S. Cl.
CPC ...
H01L 29/861 (2013.01); H01L 21/26513 (2013.01); H01L 29/04 (2013.01); H01L 29/0619 (2013.01); H01L 29/0623 (2013.01); H01L 29/0692 (2013.01); H01L 29/16 (2013.01); H01L 29/407 (2013.01); H01L 29/417 (2013.01); H01L 29/6609 (2013.01); H01L 29/66136 (2013.01);
Abstract

A new semiconductor rectifier structure. In general, a MOS-transistor-like structure is located above a JFET-like deeper structure. The present application teaches ways to combine and optimize these two structures in a merged device so that the resulting combined structure achieves both a low forward voltage and a high reverse breakdown voltage in a relatively small area. In one class of innovative implementations, an insulated (or partially insulated) trench is used to define a vertical channel in a body region along the sidewall of a trench, so that majority carriers from a 'source' region (typically n+) can flow through the channel. An added 'pocket' diffusion, of the same conductivity type as the body region (p-type in this example), provides an intermediate region around the bottom of the trench. This intermediate diffusion, and an additional deep region of the same conductivity type, define a deep JFET-like device which is in series with the MOS channel portion of the diode. This advantageously permits the MOS channel portion to be reasonably short, and to have a reasonably low threshold voltage, since the high-voltage withstand characteristics are defined by the deep JFET-like device.


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