The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2020

Filed:

Apr. 10, 2019
Applicant:

Shin-etsu Chemical Co., Ltd., Tokyo, JP;

Inventors:

Masahiro Fukushima, Joetsu, JP;

Masayoshi Sagehashi, Joetsu, JP;

Koji Hasegawa, Joetsu, JP;

Jun Hatakeyama, Joetsu, JP;

Kazuhiro Katayama, Joetsu, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/038 (2006.01); C08F 220/28 (2006.01); C09D 133/16 (2006.01); C07D 307/93 (2006.01); C07D 493/08 (2006.01); C07D 493/18 (2006.01); G03F 7/004 (2006.01); G03F 7/32 (2006.01); C07C 69/653 (2006.01); C08F 220/68 (2006.01); G03F 7/16 (2006.01); G03F 7/20 (2006.01);
U.S. Cl.
CPC ...
G03F 7/0382 (2013.01); C07C 69/653 (2013.01); C07D 307/93 (2013.01); C07D 493/08 (2013.01); C07D 493/18 (2013.01); C08F 220/28 (2013.01); C08F 220/68 (2013.01); C09D 133/16 (2013.01); G03F 7/0045 (2013.01); G03F 7/0046 (2013.01); G03F 7/162 (2013.01); G03F 7/2006 (2013.01); G03F 7/322 (2013.01); G03F 7/327 (2013.01); C07C 2601/14 (2017.05); C07C 2602/42 (2017.05); C07C 2603/74 (2017.05);
Abstract

A monomer of formula (1a) or (1b) is provided wherein A is a polymerizable group, R-Rare monovalent hydrocarbon groups, Xis a divalent hydrocarbon, group, Zis an aliphatic group, Zforms an alicyclic group, k=0 or 1, m=1 or 2, n=1 to 4. A useful polymer is obtained by polymerizing the monomer. A resist composition comprising the polymer has improved development properties and is processed to form a negative pattern having high contrast, high resolution and etch resistance which is insoluble in alkaline developer.


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