The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2019

Filed:

Aug. 04, 2017
Applicant:

Ebara Corporation, Tokyo, JP;

Inventors:

Takashi Mitsuya, Tokyo, JP;

Ryuya Koizumi, Tokyo, JP;

Toshio Yokoyama, Tokyo, JP;

Masashi Shimoyama, Tokyo, JP;

Kunio Oishi, Tokyo, JP;

Assignee:

EBARA CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C25D 17/00 (2006.01); C25D 21/12 (2006.01); H01L 21/768 (2006.01); H01L 23/00 (2006.01); H01L 21/66 (2006.01); H01L 21/288 (2006.01); C25D 17/06 (2006.01);
U.S. Cl.
CPC ...
C25D 17/001 (2013.01); C25D 21/12 (2013.01); H01L 21/76879 (2013.01); H01L 22/00 (2013.01); H01L 24/11 (2013.01); C25D 17/004 (2013.01); C25D 17/008 (2013.01); C25D 17/06 (2013.01); H01L 21/2885 (2013.01); H01L 21/76885 (2013.01); H01L 21/76898 (2013.01); H01L 2224/117 (2013.01); H01L 2224/11462 (2013.01);
Abstract

A plating system comprising a plating tank for applying plate processing to a substrate, a sensor configured to measure actual plating film thickness of the substrate, and a controller configured to control plating current supplied to the plating tank and plating time for the plate processing of the substrate within the plating tank. The controller is capable of setting target plating film thickness, plating current, and plating time as a plate processing recipe. At least one of the plating current and the plating time is automatically corrected so that the actual plating film thickness and the target plating film thickness become equal to each other, and the result is reflected in the plate processing for the subsequent substrate.


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