The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 2019

Filed:

Jan. 05, 2018
Applicant:

Tel Epion Inc., Billerica, MA (US);

Inventors:

Matthew C. Gwinn, Winchendon, MA (US);

Martin D. Tabat, Nashua, NH (US);

Kenneth Regan, Beverly, MA (US);

Allen J. Leith, Brookline, NH (US);

Michael Graf, Belmont, MA (US);

Assignee:

TEL Epion Inc., Billerica, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/304 (2006.01); H01J 37/20 (2006.01); H01J 37/08 (2006.01); H01J 37/147 (2006.01);
U.S. Cl.
CPC ...
H01J 37/304 (2013.01); H01J 37/08 (2013.01); H01J 37/147 (2013.01); H01J 37/20 (2013.01); H01J 2237/0473 (2013.01); H01J 2237/0812 (2013.01); H01J 2237/202 (2013.01); H01J 2237/20228 (2013.01); H01J 2237/30472 (2013.01);
Abstract

An apparatus and method for processing a workpiece with a beam is described. The apparatus includes a vacuum chamber having a beam-line for forming a particle beam and treating a workpiece with the particle beam, and a scanner for translating the workpiece through the particle beam. The apparatus further includes a scanner control circuit coupled to the scanner, and configured to control a scan property of the scanner, and a beam control circuit coupled to at least one beam-line component, and configured to control the beam flux of the particle beam according to a duty cycle for switching between at least two different states during processing.


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