The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2019

Filed:

Oct. 30, 2017
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

Su-Hao Liu, Jhongpu Township, TW;

Huicheng Chang, Tainan, TW;

Chia-Cheng Chen, Hsinchu, TW;

Liang-Yin Chen, Hsinchu, TW;

Kuo-Ju Chen, Taichung, TW;

Chun-Hung Wu, New Taipei, TW;

Chang-Miao Liu, Hsinchu, TW;

Huai-Tei Yang, Hsinchu, TW;

Lun-Kuang Tan, Hsinchu, TW;

Wei-Ming You, Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/02 (2006.01); H01L 29/08 (2006.01); H01L 29/167 (2006.01); H01L 29/78 (2006.01); H01L 21/285 (2006.01); H01L 29/66 (2006.01); H01L 21/265 (2006.01);
U.S. Cl.
CPC ...
H01L 29/0847 (2013.01); H01L 21/0257 (2013.01); H01L 21/02532 (2013.01); H01L 21/26513 (2013.01); H01L 21/28518 (2013.01); H01L 29/167 (2013.01); H01L 29/66795 (2013.01); H01L 29/785 (2013.01); H01L 29/7848 (2013.01);
Abstract

The present disclosure relates generally to doping for conductive features in a semiconductor device. In an example, a structure includes an active region of a transistor. The active region includes a source/drain region, and the source/drain region is defined at least in part by a first dopant having a first dopant concentration. The source/drain region further includes a second dopant with a concentration profile having a consistent concentration from a surface of the source/drain region into a depth of the source/drain region. The consistent concentration is greater than the first dopant concentration. The structure further includes a conductive feature contacting the source/drain region at the surface of the source/drain region.


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