The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 2019
Filed:
Jul. 15, 2015
Sap SE, Walldorf, DE;
Shane Bracher, Morningside, AU;
Mark Daniel Holmes, Paddington, AU;
Liam Alexander Mischewski, Brisbane, AU;
Asadul Khandoker Islam, Coorparoo, AU;
Michael McClenaghan, Brisbane, AU;
Daniel Ricketts, Toowong, AU;
Glenn Neuber, New Farm, AU;
Hoyoung Jeung, Tennyson, AU;
Priya Vijayarajendran, Saratoga, CA (US);
SAP SE, Waldorf, DE;
Abstract
Customer churn risk scores are based on a multi-variable churn risk model relating customer and customer account characteristics to a risk of customer churn. A computer-implemented method of generating and presenting churn risk scores of customers of a telecommunication provider involves analyzing, on an in-memory database platform, customer call data records and customer records to calculate a churn likelihood value, an influence factor value, and an average spend value for each customer. The method assigns a churn risk score to each customer according to the model using the calculated churn likelihood value, the calculated influence factor value, and the calculated average spend value as input to the model. The churn risk scores for one or more customers are displayed visually on an interactive computer-user interface (UI).