The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2019

Filed:

Jan. 10, 2017
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Toyohiro Aoki, Yokohama, JP;

Akihiro Horibe, Yokohama, JP;

Hiroyuki Mori, Yasu, JP;

Yasumitsu Orii, Higashi Ohmi, JP;

Kazushige Toriyama, Yamato, JP;

Ting-Li Yang, Tainan, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23K 31/02 (2006.01); B23K 1/00 (2006.01); B23K 1/19 (2006.01); H05K 3/34 (2006.01); B23K 35/26 (2006.01); B23K 35/30 (2006.01); C22C 9/02 (2006.01); C22C 13/00 (2006.01); H01L 21/48 (2006.01); H01L 21/56 (2006.01); H01L 23/00 (2006.01); B23K 101/40 (2006.01); B23K 101/42 (2006.01); B23K 103/00 (2006.01);
U.S. Cl.
CPC ...
B23K 1/0016 (2013.01); B23K 1/19 (2013.01); B23K 35/262 (2013.01); B23K 35/302 (2013.01); C22C 9/02 (2013.01); C22C 13/00 (2013.01); H01L 21/4853 (2013.01); H01L 21/563 (2013.01); H01L 24/13 (2013.01); H01L 24/16 (2013.01); H01L 24/81 (2013.01); H05K 3/3436 (2013.01); H05K 3/3463 (2013.01); H05K 3/3494 (2013.01); B23K 2101/40 (2018.08); B23K 2101/42 (2018.08); B23K 2103/56 (2018.08); H01L 2224/13147 (2013.01); H01L 2224/13155 (2013.01); H01L 2224/16237 (2013.01); H01L 2224/16238 (2013.01); H01L 2224/8112 (2013.01); H01L 2224/8181 (2013.01); H01L 2224/81097 (2013.01); H01L 2224/81193 (2013.01); H01L 2924/0103 (2013.01); H01L 2924/014 (2013.01); H01L 2924/0105 (2013.01); H01L 2924/01022 (2013.01); H01L 2924/01026 (2013.01); H01L 2924/01027 (2013.01); H01L 2924/01028 (2013.01); H01L 2924/01029 (2013.01); H01L 2924/01032 (2013.01); H01L 2924/01047 (2013.01); H01L 2924/01049 (2013.01); H01L 2924/01079 (2013.01); H01L 2924/01083 (2013.01); Y02P 70/613 (2015.11);
Abstract

Forming a solder joint between metal layers by preparing a structure having solder material placed between two metal layers and heating the structure to grow an intermetallic compound in a space between the two metal layers. Growing the intermetallic compound includes setting a first surface, in contact with the solder material between the two metal layers, to a first temperature, thereby enabling growth of the intermetallic compound; setting a second surface, in contact with the solder material between the two metal layers, to a second temperature, wherein the second temperature is higher than the first temperature; and maintaining a temperature gradient (temperature/unit thickness) between the two metal layers at a predetermined value or higher until the intermetallic compound substantially fills the space between the two metal layers.


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