The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 12, 2019

Filed:

Feb. 28, 2017
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Yusaku Hashimoto, Koshi, JP;

Takeshi Shimoaoki, Koshi, JP;

Masahiro Fukuda, Koshi, JP;

Kouichirou Tanaka, Koshi, JP;

Assignee:

Tokyo Electron Limited, Minato-Ku, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/32 (2006.01); G03F 7/26 (2006.01); B05D 1/00 (2006.01); G03F 7/30 (2006.01); G03F 7/40 (2006.01); H01L 21/027 (2006.01); H01L 21/67 (2006.01);
U.S. Cl.
CPC ...
G03F 7/26 (2013.01); B05D 1/002 (2013.01); B05D 1/005 (2013.01); G03F 7/3021 (2013.01); G03F 7/3028 (2013.01); G03F 7/3092 (2013.01); G03F 7/32 (2013.01); G03F 7/40 (2013.01); H01L 21/0274 (2013.01); H01L 21/6715 (2013.01);
Abstract

A development method includes: a development step of supplying a developing solution to a surface of a substrate for manufacturing a semiconductor device after undergoing formation of a resist film and exposure, to perform development; a first rotation step of, after the development step, increasing revolution speed of the substrate to rotate the substrate in a first rotational direction around a central axis so as to spin off and remove part of the developing solution from the substrate; and a second rotation step of, after the first rotation step, rotating the substrate in a second rotational direction reverse to the first rotational direction so as to spin off and remove the developing solution remaining on the substrate from the substrate.


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