The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 29, 2019

Filed:

Jul. 14, 2016
Applicant:

Hitachi High-technologies Corporation, Tokyo, JP;

Inventors:

Hiroyuki Kobayashi, Tokyo, JP;

Nobuya Miyoshi, Tokyo, JP;

Kazunori Shinoda, Tokyo, JP;

Kenji Maeda, Tokyo, JP;

Satoshi Sakai, Tokyo, JP;

Masaru Izawa, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/32 (2006.01); H01L 21/67 (2006.01);
U.S. Cl.
CPC ...
H01J 37/321 (2013.01); H01J 37/32724 (2013.01); H01L 21/67115 (2013.01); H01J 2237/334 (2013.01);
Abstract

A plasma processing apparatus includes a processing chamber to be depressurized in a vacuum vessel with a sidewall made of a transparent or translucent dielectric material, a stage in the processing chamber to mount a wafer thereon, a coil disposed around an outer side of the sidewall and supplied with radio-frequency power for forming plasma above the stage in the processing chamber, a lamp disposed above the coil outside the vacuum vessel which radiates light onto the wafer, and a reflector disposed the coil and reflecting light to irradiate an inside of the processing chamber.


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