The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 01, 2019

Filed:

Jan. 23, 2017
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsin-Chu, TW;

Inventors:

Jyuh-Fuh Lin, Miaoli County, TW;

Cheng-Hung Chen, Hsinchu County, TW;

Pei-Yi Liu, Changhua County, TW;

Wen-Chuan Wang, Hsinchu, TW;

Shy-Jay Lin, Hsinchu County, TW;

Burn Jeng Lin, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); H01J 37/317 (2006.01); H01L 21/027 (2006.01);
U.S. Cl.
CPC ...
H01J 37/3174 (2013.01); H01L 21/0277 (2013.01); H01J 2237/31761 (2013.01); H01J 2237/31769 (2013.01);
Abstract

The present disclosure provides one embodiment of an IC method. First pattern densities (PDs) of a plurality of templates of an IC design layout are received. Then a high PD outlier template and a low PD outlier template from the plurality of templates are identified. The high PD outlier template is split into multiple subsets of template and each subset of template carries a portion of PD of the high PD outlier template. A PD uniformity (PDU) optimization is performed to the low PD outlier template and multiple individual exposure processes are applied by using respective subset of templates.


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