The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 18, 2018

Filed:

Nov. 19, 2015
Applicant:

Mitsubishi Electric Corporation, Chiyoda-ku, JP;

Inventors:

Rina Tanaka, Tokyo, JP;

Yasuhiro Kagawa, Tokyo, JP;

Katsutoshi Sugawara, Tokyo, JP;

Naruhisa Miura, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/78 (2006.01); H01L 29/10 (2006.01); H01L 21/04 (2006.01); H01L 29/66 (2006.01); H01L 29/739 (2006.01); H01L 29/06 (2006.01); H01L 29/16 (2006.01);
U.S. Cl.
CPC ...
H01L 29/1045 (2013.01); H01L 21/0465 (2013.01); H01L 29/0623 (2013.01); H01L 29/66068 (2013.01); H01L 29/7397 (2013.01); H01L 29/7813 (2013.01); H01L 29/1608 (2013.01);
Abstract

A drift layer of a first conductivity type is made of silicon carbide. A body region of a second conductivity type is provided on the drift layer. A source region of the first conductivity type is provided on the body region. A source electrode is connected to the source region. A gate insulating film is provided on side and bottom surfaces of a trench which penetrates the body region and the source region. A gate electrode is provided in the trench with the gate insulating film interposed therebetween. A trench-bottom-surface protective layer of the second conductivity type provided below the bottom surface of the trench in the drift layer is electrically connected to the source electrode. The trench-bottom-surface protective layer has a high-concentration protective layer, and a first low-concentration protective layer provided below the high-concentration protective layer and having an impurity concentration lower than that of the high-concentration protective layer.


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