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For the Inventor, By the Inventor

Karme Yosef, Israel

Zvi Nir

This inventor holds 2 USPTO granted patents. Top assignee: Applied Materials Israel Limited. Active years: 2010-2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Zvi Nir. Retrieved from https://idiyas.com/inventor/zvi-nir

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 2

% Patents Active = 100.0

Average Co-Inventor Count = 1.6

ph-index = 1

Forward Citations = 48(Granted Patents)


Company Filing History:

goldMedal2 out of 574 
 
Applied Materials Israel Limited
 patents

Years Active: 2010-2020

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2 patents (USPTO):Explore Patents
1. 10541104 - System and method for scanning an object with an electron beam using overlapping scans and electron beam counter-deflection (2020-01-21),
2. 7759642 - Pattern invariant focusing of a charged particle beam (2010-07-20),

Title: Zvi Nir: Pioneering Israeli Inventor

Introduction: Zvi Nir, a distinguished inventor hailing from Karmei Yosef, Israel, has made significant contributions to the field of innovation with his groundbreaking creations.

Latest Patents: Zvi Nir holds several patents in various technological domains, showcasing his versatility and ingenuity in inventing novel solutions to complex problems.

Career Highlights: Throughout his illustrious career, Zvi Nir has been recognized for his innovative spirit and has received numerous accolades for his pioneering work in the realm of technology and invention.

Collaborations: Zvi Nir has collaborated with leading research institutions, universities, and companies worldwide, fostering a culture of innovation and knowledge-sharing to drive progress in the field of technology.

Conclusion: Zvi Nir's passion for innovation and his relentless pursuit of excellence continue to inspire aspiring inventors and shape the future of technological advancements globally.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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