San Ramon, CA, United States of America

Zizhuo Xie

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignees: Raycan Technology Co., Ltd (Su Zhou), X-Z Lab, Inc.. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Zizhuo Xie. Retrieved from https://idiyas.com/inventor/zizhuo-xie

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Zizhuo Xie: Innovator in Imaging Technology

Introduction

Zizhuo Xie is a notable inventor based in San Ramon, California. He has made significant contributions to the field of imaging technology, particularly through his innovative methods in manufacturing and data analysis.

Latest Patents

Zizhuo Xie holds a patent for an "Imaging subject mould manufacturing method, and individualized imaging method." This method involves several steps, including scanning an imaging subject mold, calibrating and optimizing the imaging system, and applying the results to enhance future imaging processes. His work aims to achieve higher quality imaging results and improved data analysis.

Career Highlights

Throughout his career, Zizhuo Xie has worked with various companies, including Raycan Technology Co., Ltd in Suzhou and X-Z Lab, Inc. His experience in these organizations has allowed him to refine his skills and contribute to advancements in imaging technology.

Collaborations

Zizhuo Xie has collaborated with professionals in his field, including his coworker Qingguo Xie. These partnerships have fostered innovation and the sharing of ideas within the imaging technology sector.

Conclusion

Zizhuo Xie's contributions to imaging technology through his patented methods and collaborative efforts highlight his role as an influential inventor in this field. His work continues to impact the quality and efficiency of imaging processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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