The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 03, 2018

Filed:

Nov. 18, 2014
Applicants:

Raycan Technology Co., Ltd. (Su Zhou), Suzhou, Jiangsu, CN;

X-z Lab, Inc., San Ramon, CA (US);

Inventors:

Zizhuo Xie, San Ramon, CA (US);

Qingguo Xie, Suzhou, CN;

Assignees:

RAYCAN TECHNOLOGY CO., LTD. (SU ZHOU), Suzhou, Jiangsu, CN;

X-Z LAB, INC., San Ramon, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 8/00 (2006.01); A61B 5/055 (2006.01); A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
A61B 6/582 (2013.01); A61B 5/055 (2013.01); A61B 6/00 (2013.01); A61B 6/032 (2013.01); A61B 6/037 (2013.01); A61B 8/00 (2013.01);
Abstract

An individualized imaging method, comprising the following steps: scanning an imaging subject mold; conducting calibration, rectification and optimization on the imaging system according to the information obtained after mold imaging: scanning the imaging subject with the calibrated, rectified and optimized imaging system; optimizing information obtained by scanning the imaging subject and the mold thereof to obtain higher quality imaging results and data analysis result; and applying the higher quality imaging results and data analysis results to optimize the mold for use in the next imaging.


Find Patent Forward Citations

Xie, Zizhuo. (2018). Imaging subject mould manufacturing method, and individualized imaging method (U.S. Patent No. 9931097). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9931097

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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