Shanghai, China

Ziping Li

This inventor holds 1 USPTO granted patent. Top assignee: Chinese Academy of Sciences. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ziping Li. Retrieved from https://idiyas.com/inventor/ziping-li-qdshwwmw

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: The Innovations of Ziping Li

Introduction

Ziping Li is a prominent inventor based in Shanghai, China. He has made significant contributions to the field of terahertz technology. His work focuses on developing advanced measurement systems that enhance the analysis of terahertz spectra.

Latest Patents

One of Ziping Li's notable patents is a terahertz spectrum measurement system and method for analyzing a terahertz spectrum of a substance. This innovative system comprises two terahertz quantum cascade lasers with their emission ports arranged oppositely, along with a vacuum hood positioned between the emission ports. The system allows for a separate terahertz dual frequency comb while retaining the advantages of the on-chip dual frequency comb system. This invention addresses the challenge of directly measuring the terahertz spectra of substances.

Career Highlights

Ziping Li is affiliated with the Chinese Academy of Sciences, where he conducts his research and development activities. His work has garnered attention for its potential applications in various scientific fields.

Collaborations

He collaborates with esteemed colleagues, including Hua Li and Wenjian Wan, to further advance his research initiatives.

Conclusion

Ziping Li's contributions to terahertz technology exemplify the innovative spirit of modern science. His patent reflects a significant advancement in the measurement and analysis of terahertz spectra, showcasing his dedication to pushing the boundaries of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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