The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2023

Filed:

Sep. 30, 2019
Applicant:

Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, CN;

Inventors:

Hua Li, Shanghai, CN;

Ziping Li, Shanghai, CN;

Wenjian Wan, Shanghai, CN;

Juncheng Cao, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/3581 (2014.01); G01N 21/01 (2006.01); H01S 5/042 (2006.01); H01S 5/34 (2006.01); G01N 21/39 (2006.01);
U.S. Cl.
CPC ...
G01N 21/3581 (2013.01); G01N 21/01 (2013.01); H01S 5/042 (2013.01); H01S 5/3402 (2013.01); G01N 2021/0112 (2013.01); G01N 2021/396 (2013.01); G01N 2201/06113 (2013.01);
Abstract

The present application provides a terahertz spectrum measurement system and a method for analyzing a terahertz spectrum of a substance, wherein the terahertz spectrum measurement system comprises: two terahertz quantum cascade lasers with their emission ports arranged oppositely; and a vacuum hood arranged between the emission ports of two terahertz quantum cascade lasers. The terahertz spectrum measurement system and the method for analyzing a terahertz spectrum of a substance realize a separate terahertz dual frequency comb while retaining the advantages of the on-chip dual frequency comb system, which solves the problem that the on-chip dual frequency comb cannot directly measure the terahertz spectra of substances.


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