Pittsburgh, PA, United States of America

Zhuo Hui

USPTO Granted Patents = 6 

Average Co-Inventor Count = 3.4

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2017-2023

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6 patents (USPTO):Explore Patents

Title: Zhuo Hui: Innovator in Material Capture Technology

Introduction

Zhuo Hui is a notable inventor based in Pittsburgh, PA (US), recognized for his contributions to material capture technology. He holds a total of 6 patents, showcasing his innovative approach to understanding and analyzing material surfaces.

Latest Patents

One of Zhuo Hui's latest patents focuses on material capture using imaging. This patent outlines methods and systems for performing material capture to determine properties of an imaged surface. A plurality of images depicting a material surface can be received, which are then calibrated to align corresponding pixels. This calibration process allows for the determination of reflectance information for at least a portion of the aligned pixels. After calibration, a set of reference materials from a material library can be selected using the calibrated images. This set of reference materials is instrumental in determining a material model that accurately represents the properties of the material surface.

Career Highlights

Throughout his career, Zhuo Hui has worked with prominent companies such as Adobe Systems Inc. and Adobe, Inc. His experience in these organizations has contributed significantly to his expertise in the field of imaging and material analysis.

Collaborations

Zhuo Hui has collaborated with talented individuals, including Kalyan Krishna Sunkavalli and Sunil Sharadchandra Hadap. These collaborations have further enriched his work and innovations in material capture technology.

Conclusion

Zhuo Hui's innovative work in material capture technology and his impressive portfolio of patents highlight his significant contributions to the field. His collaborations and career experiences continue to influence advancements in imaging and material analysis.

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