The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 20, 2023

Filed:

Oct. 26, 2020
Applicant:

Adobe Inc., San Jose, CA (US);

Inventors:

Kalyan Krishna Sunkavalli, San Jose, CA (US);

Sunil Hadap, Dublin, CA (US);

Joon-Young Lee, Milpitas, CA (US);

Zhuo Hui, Pittsburgh, PA (US);

Assignee:

ADOBE Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/49 (2017.01); G01N 21/55 (2014.01); G06T 7/90 (2017.01); G06T 7/40 (2017.01); G06T 3/00 (2006.01); G06T 7/60 (2017.01); G06T 17/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/49 (2017.01); G01N 21/55 (2013.01); G06T 3/0068 (2013.01); G06T 7/40 (2013.01); G06T 7/60 (2013.01); G06T 7/90 (2017.01); G06T 17/00 (2013.01); G06T 2200/08 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/10152 (2013.01);
Abstract

Methods and systems are provided for performing material capture to determine properties of an imaged surface. A plurality of images can be received depicting a material surface. The plurality of images can be calibrated to align corresponding pixels of the images and determine reflectance information for at least a portion of the aligned pixels. After calibration, a set of reference materials from a material library can be selected using the calibrated images. The set of reference materials can be used to determine a material model that accurately represents properties of the material surface.


Find Patent Forward Citations

Loading…