Company Filing History:
Years Active: 2009
Title: Zhiyan Huang - Innovator in Wafer Inspection Technology
Introduction
Zhiyan Huang is a notable inventor based in Austin, TX, who has made significant contributions to the field of substrate inspection technology. With a focus on enhancing the efficiency and accuracy of wafer edge inspection, Huang's work is pivotal in the semiconductor industry.
Latest Patents
Huang holds a patent for an "Automatic Wafer Edge Inspection and Review System." This innovative system provides a substrate illumination and inspection mechanism that is particularly effective for inspecting the edges of substrates. The system utilizes a light diffuser equipped with multiple lights to ensure uniform diffuse illumination. An optic and imaging system positioned outside the light diffuser allows for comprehensive inspection of various surfaces, including specular surfaces. The optic can be rotated radially around the substrate edge's center point, enabling focused inspection of all surfaces.
Career Highlights
Zhiyan Huang is currently employed at Accretech USA, Inc., where she continues to develop cutting-edge technologies in wafer inspection. Her expertise and innovative approach have positioned her as a key player in her field.
Collaborations
Huang collaborates with talented colleagues, including Ju Jin and Satish Sadam, contributing to a dynamic work environment that fosters innovation and creativity.
Conclusion
Zhiyan Huang's contributions to wafer inspection technology exemplify her commitment to advancing the semiconductor industry. Her innovative patent and collaborative spirit highlight her role as a leading inventor in this critical field.