Wuhan, China

Zhihao Xi

This inventor holds 1 USPTO granted patent. Top assignee: Hubei University. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Zhihao Xi. Retrieved from https://idiyas.com/inventor/zhihao-xi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Zhihao Xi: Innovator in Surface Defect Detection Technology

Introduction

Zhihao Xi is a prominent inventor based in Wuhan, China. He has made significant contributions to the field of surface defect detection through his innovative methods and systems. His work is particularly relevant in industries where quality control is paramount.

Latest Patents

Zhihao Xi holds a patent for a "Surface defect detection method, system, equipment, and terminal thereof." This patent describes a comprehensive approach to detecting surface defects using advanced image processing techniques. The method involves several key steps: first, a Local Binary Pattern (LBP) texture feature extraction algorithm is employed for pre-processing the images. Next, a Scale-Invariant Feature Transform (SIFT) feature-point matching algorithm is utilized to identify key feature points in the images for comparison. Finally, the system conducts defect detection by matching local feature points from the captured image with those in a benchmark image library, allowing for detailed comparisons and accurate defect identification. This innovative system is designed to be user-friendly, requiring minimal setup and training, thus reducing personnel training costs significantly. The basic structure of the system is simple, consisting of just a computer, camera, and light source, making it highly mobile and easy to use.

Career Highlights

Zhihao Xi is affiliated with Hubei University, where he continues to advance his research and development in surface defect detection technologies. His work has garnered attention for its practical applications and efficiency in quality control processes.

Collaborations

Zhihao Xi collaborates with notable colleagues, including Kansong Chen and Zuyang Liu, who contribute to his research endeavors and innovations in the field.

Conclusion

Zhihao Xi's contributions to surface defect detection technology exemplify the impact of innovative thinking in enhancing quality control processes. His patent reflects a commitment to improving efficiency and reducing costs in industrial applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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