The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2025
Filed:
Dec. 02, 2024
Hubei University, Wuhan, CN;
Hubei University, Wuhan, CN;
Abstract
The disclosure discloses a surface defect detection method, system, equipment, and terminal, comprising: S, LBP operator: before comparing the benchmark image with the actual shot image, a LBP texture feature extraction algorithm is first used for pre-processing; S, Sift feature-point matching: adding a Sift feature-point matching algorithm to calculate key feature points in the image and compare; S, defect detection: when the local feature points of the shot image are successfully matching with a certain image in the benchmark image library, a detailed comparison will be made and complete defect detection. The disclosure integrates various image processing methods in advance without any setting by users. After running the system with one click, it can automatically perform detection, greatly reducing personnel training costs. The disclosure has simple structure and low cost. The basic structure only needs a computer, camera, and light source, making it easy to use and with highly mobile.