Xi'an, China

Zhenyu Wang

This inventor holds 1 USPTO granted patent. Top assignee: Xi'an Jiaotong University. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Zhenyu Wang. Retrieved from https://idiyas.com/inventor/zhenyu-wang-qjdtv928

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Zhenyu Wang: Innovator in Optical Measurement Technology

Introduction

Zhenyu Wang is a prominent inventor based in Xi'an, China. He has made significant contributions to the field of optical measurement technology. His innovative work focuses on developing methods and devices that enhance the measurement of plasma magnetic fields.

Latest Patents

Zhenyu Wang holds a patent for an "Optical measuring device and method for plasma magnetic field with adjustable sensitivity." This invention presents a novel approach to measuring plasma magnetic fields using an optical rotation measurement system based on a pulsed laser beam. The method involves constructing an optical rotation measurement system, processing optical rotation images, and obtaining a distribution of rotation angles. Additionally, it includes measuring phase shifts in interference images to calculate electron areal densities and average magnetic fields.

Career Highlights

Zhenyu Wang is affiliated with Xi'an Jiaotong University, where he contributes to research and development in optical measurement technologies. His work has garnered attention for its practical applications in various scientific fields.

Collaborations

Zhenyu Wang collaborates with notable colleagues, including Wei Wang and Zhiyuan Jiang. Their combined expertise enhances the research output and innovation potential within their projects.

Conclusion

Zhenyu Wang's contributions to optical measurement technology exemplify the impact of innovative thinking in scientific research. His patent on measuring plasma magnetic fields showcases his commitment to advancing technology in this critical area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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