Santa Clara, CA, United States of America

Zhenyu Wang

This inventor holds 1 USPTO granted patent. Top assignee: Alpha and Omega Semiconductor International LP. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Zhenyu Wang. Retrieved from https://idiyas.com/inventor/zhenyu-wang-lrgnw3ag

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Zhenyu Wang: Innovator in Power Transistor Temperature Monitoring

Introduction

Zhenyu Wang is a notable inventor based in Santa Clara, California. He has made significant contributions to the field of semiconductor technology, particularly in the area of temperature monitoring for power transistors.

Latest Patents

Zhenyu Wang holds a patent for a "Method and circuit for sensing MOSFET temperature for load switch application." This invention discloses a method and device for temperature monitoring of a power transistor formed in a semiconductor die. The design includes a temperature-sensing resistor that is coupled to the voltage input side of the power transistor. A controller is configured to detect the voltage across the resistor and trigger temperature-related corrective actions based on the detected voltage.

Career Highlights

Zhenyu Wang is currently employed at Alpha and Omega Semiconductor International LP, where he continues to innovate in the semiconductor industry. His work focuses on enhancing the efficiency and reliability of power transistors.

Collaborations

Zhenyu has collaborated with notable colleagues such as Jian Yin and Lingpeng Guan, contributing to advancements in semiconductor technology.

Conclusion

Zhenyu Wang's innovative work in temperature monitoring for power transistors exemplifies his commitment to advancing semiconductor technology. His contributions are significant in ensuring the reliability and efficiency of electronic devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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