Changzhou, China

Zhenyu Dai

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignees: Mettler Toledo (Changzhou) Measurement Technology Ltd., Mettler-Toledo (Changzhou) Precision Instruments Ltd., Mettler-Toledo International Trading (Shanghai). Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Zhenyu Dai. Retrieved from https://idiyas.com/inventor/zhenyu-dai-3bte8z83

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile



Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Zhenyu Dai - Innovator in Volume Measurement Technology.

Introduction

Zhenyu Dai is a notable inventor based in Changzhou, China. He has made significant contributions to the field of measurement technology, particularly through his innovative patent related to volume measurement methods.

Latest Patents

Zhenyu Dai holds a patent for a "Volume measurement method and an apparatus based on a depth camera, and a computer-readable medium." This invention provides a method and apparatus that utilizes a depth camera to accurately measure the volume of objects. The process involves acquiring a first depth image of a reference countertop, which includes coordinate and depth data of pixels. The data is then substituted into empirical equations to generate simulated images that represent height variations of the countertop. By calculating the correlation between these simulated images and the first depth image, the target image with the highest correlation is identified. This target image is used to determine the countertop height, which in turn allows for the calculation of the height and volume of the measured object. This innovative approach significantly enhances the accuracy of object volume measurement.

Career Highlights

Zhenyu Dai has worked with reputable companies in the measurement technology sector, including Mettler Toledo Measurement Technology Ltd. and Mettler-Toledo Precision Instruments Ltd. His experience in these organizations has contributed to his expertise in developing advanced measurement solutions.

Collaborations

Throughout his career, Zhenyu has collaborated with talented individuals such as Conghan Cao and Jiang Yin. These collaborations have likely fostered innovation and the exchange of ideas in the field of measurement technology.

Conclusion

Zhenyu Dai's contributions to volume measurement technology through his innovative patent demonstrate his commitment to enhancing accuracy in measurement processes. His work continues to influence the field and showcases the importance of innovation in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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