The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 2026
Filed:
Apr. 24, 2022
Mettler-toledo (Changzhou) Measurement Technology Ltd., Changzhou, CN;
Mettler-toledo (Changzhou) Precision Instruments Ltd., Changzhou, CN;
Mettler-toledo International Trading (Shanghai) Co., Ltd., Shanghai, CN;
Conghan Cao, Changzhou, CN;
Jiang Yin, Changzhou, CN;
Song Zhang, Changzhou, CN;
Chao Fang, Changzhou, CN;
Hongqing Song, Changzhou, CN;
Zhenyu Dai, Changzhou, CN;
Fenping Qian, Changzhou, CN;
Huanbing Cheng, Changzhou, CN;
Shenhui Wang, Changzhou, CN;
Mettler-Toledo (Changzhou) Measurement Technology Ltd., Changzhou, CN;
Mettler-Toledo (Changzhou) Precision Instruments Ltd., Changzhou, CN;
Mettler-Toledo International Trading (Shanghai) Co., Ltd., Shanghai, CN;
Abstract
A volume measurement method and apparatus using a depth camera, and a computer-readable medium, are provided. A first depth image of a reference countertop is acquired which includes coordinate and depth data of pixels, the reference countertop adapted for placement of a measured object. The coordinate and depth data are substituted into countertop empirical equations to obtain simulated images. Each of the countertop empirical equations represent a height variation pattern of the reference countertop. A correlation between each of the simulated images and the first depth image is calculated. A simulated image with the highest correlation is used as a target image of the reference countertop. A countertop height of the reference countertop is obtained based on the target image, a height of the measured object is calculated using the countertop height, and a volume of the measured object is calculated using the height. These disclosures improve accuracy of object volume measurement.