This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignees: Mettler Toledo (Changzhou) Measurement Technology Ltd., Mettler-Toledo (Changzhou) Precision Instruments Ltd., Mettler-Toledo International Trading (Shanghai). Co., Ltd.. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Jiang Yin - Innovator in Volume Measurement Technology
Introduction
Jiang Yin is a notable inventor based in Changzhou, China. He has made significant contributions to the field of measurement technology, particularly through his innovative patent related to volume measurement methods.
Latest Patents
Jiang Yin holds a patent for a "Volume measurement method and an apparatus based on a depth camera, and a computer-readable medium." This invention provides a method and apparatus that utilizes a depth camera to accurately measure the volume of objects. The process involves acquiring a first depth image of a reference countertop, which includes coordinate and depth data of pixels. By substituting this data into countertop empirical equations, simulated images are generated to determine the height of the measured object. This method enhances the accuracy of volume measurements, making it a valuable advancement in the field.
Career Highlights
Throughout his career, Jiang Yin has worked with prominent companies such as Mettler Toledo Measurement Technology Ltd. and Mettler-Toledo Precision Instruments Ltd. His experience in these organizations has allowed him to refine his skills and contribute to innovative measurement solutions.
Collaborations
Jiang has collaborated with talented individuals in his field, including Conghan Cao and Song Zhang. These partnerships have fostered a creative environment that encourages the development of cutting-edge technologies.
Conclusion
Jiang Yin's contributions to volume measurement technology exemplify his innovative spirit and dedication to improving accuracy in measurements. His patent and career achievements highlight his role as a significant figure in the field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile