Zhengyun Wu

Title: Innovations of Zhengyun Wu

Introduction

Zhengyun Wu is a notable inventor based in Beijing, China. He has made significant contributions to the field of testing devices and methods, holding a total of 2 patents. His work focuses on enhancing the efficiency and effectiveness of testing technologies.

Latest Patents

Zhengyun Wu's latest patents include a testing probe, testing device, and testing method. The first patent provides a testing probe that consists of a probe holder and a probe body, which can move relative to the holder. This probe body is designed to be electrically connected to the probe holder within a specified travel distance to output a testing signal. Additionally, it can be electrically disconnected from the probe holder within another travel distance. The second patent involves an array substrate, its manufacturing method, and a testing method for a display device. This array substrate features a Test Element Group (TEG) arranged in a non-display area, which includes multiple to-be-tested elements and testing contact electrodes. Each to-be-tested element connects to at least two testing contact electrodes, with at least one electrode shared among multiple elements.

Career Highlights

Zhengyun Wu has worked with prominent companies in the technology sector, including BOE Technology Group Co., Ltd. and Hefei Xinsheng Optoelectronics Technology Co., Ltd. His experience in these organizations has allowed him to develop and refine his innovative ideas in testing technologies.

Collaborations

Throughout his career, Zhengyun Wu has collaborated with talented individuals such as Yu Ji and Chengye Wu. These partnerships have contributed to the advancement of his projects and innovations.

Conclusion

Zhengyun Wu's contributions to the field of testing devices and methods highlight his innovative spirit and dedication to technology. His patents reflect a commitment to improving testing efficiency, making him a significant figure in his field.