Boe Technology Group Co., Ltd.

Hefei Xinsheng Optoelectronics Technology Co., Ltd.

Zhengyun Wu

Tao N Zhang

Chao Zhou

Lei Song

Lei Feng

Bei Wang

Yu Ji

Youpeng Gan

Chengye Wu

Xianchun Huang

Tao Geng

The present disclosure provides in some embodiments a testing probe, including a probe holder, and a probe body at least partially extending into an interior of the probe holder and capable of moving relative to the probe holder. The probe body is configured to be electrically connected to the probe holder within a first travel distance relative to the probe holder so as to output a testing signal, and configured to be electrically disconnected from the probe holder within a second travel distance relative to the probe holder.

Testing probe, testing device and testing method

The present disclosure provides an array substrate, its manufacturing method and testing method, and a display device. The array substrate includes a (Test Element Group) TEG arranged at a non-display area and including a plurality of to-be-tested elements and a plurality of testing contact electrodes configured to test the to-be-tested elements. Each of the to-be-tested elements is connected to at least two of the testing contact electrodes, and at least one of the testing contact electrodes is shared by at least two of the to-be-tested elements.

Array substrate, its manufacturing method and testing method, and display device

Growing community of inventors

Beijing, China

Zhengyun Wu