Shenzhen, China

Zhengkai Chang

This inventor holds 1 USPTO granted patent. Top assignee: Shenzhen Supro Instruments Limited. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Zhengkai Chang. Retrieved from https://idiyas.com/inventor/zhengkai-chang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Zhengkai Chang - Innovator in Curvature Measurement Technology

Introduction

Zhengkai Chang is a prominent inventor based in Shenzhen, China. He has made significant contributions to the field of measurement technology, particularly with his innovative device for measuring curvature radius. His work is characterized by a blend of technical expertise and practical application.

Latest Patents

Zhengkai Chang holds a patent for a "Device and method for measuring curvature radius." This device includes a sample stage designed to support the sample being measured, a diffracted light array generation module that emits a diffracted light array to the sample, and a detection and analysis module that receives a reflected light array from the sample. The curvature radius is determined based on the dimensions of the reflected light array. This invention showcases his ability to integrate optical technology with measurement techniques.

Career Highlights

Zhengkai Chang is associated with Shenzhen Supro Instruments Limited, where he applies his skills in developing advanced measurement devices. His career reflects a commitment to innovation and excellence in the field of instrumentation.

Collaborations

Zhengkai Chang has worked alongside talented colleagues, including Xiaobo Zhang and Kai Liang. Their collaborative efforts contribute to the advancement of measurement technologies and enhance the capabilities of their organization.

Conclusion

Zhengkai Chang's contributions to measurement technology, particularly through his patented device, highlight his role as an innovator in the field. His work continues to influence advancements in curvature measurement techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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