Zhengdong Xi

Title: Zhengdong Xi: Innovator in Optical Inspection Technologies

Introduction

Zhengdong Xi is a prominent inventor based in Beijing, China. He has made significant contributions to the field of optical inspection technologies, holding a total of 2 patents. His work focuses on methods and apparatuses that enhance the accuracy and efficiency of defect detection in various substrates.

Latest Patents

Zhengdong Xi's latest patents include a "Method and apparatus for detecting defects" and a "Method and apparatus for determining illumination intensity for inspection." The first patent outlines a process that involves obtaining a gray-scale image of a substrate, calculating the gray-scale difference between regions, and determining the substrate's qualification based on estimated film thickness differences. The second patent describes a method for determining the optimal illumination intensity for inspection by analyzing images taken at various intensities and calculating the gray standard deviation for improved inspection accuracy.

Career Highlights

Throughout his career, Zhengdong Xi has worked with notable companies such as Chongqing BOE Optoelectronics Technology Co., Ltd. and BOE Technology Group Co., Ltd. His experience in these organizations has allowed him to develop and refine his innovative approaches to optical inspection.

Collaborations

Zhengdong Xi has collaborated with talented individuals in his field, including Chaoqiang Liu and Xu Wang. Their combined expertise has contributed to advancements in optical inspection technologies.

Conclusion

Zhengdong Xi's innovative work in optical inspection technologies has positioned him as a key figure in the industry. His patents reflect a commitment to improving inspection methods, ultimately enhancing product quality and reliability.