The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 2019
Filed:
Mar. 16, 2017
Boe Technology Group Co., Ltd., Beijing, CN;
Chongqing Boe Optoelectronics Technology Co., Ltd., Chongqing, CN;
BOE Technology Group Co., Ltd., Beijing, CN;
Chongqing BOE Optoelectronics Technology Co., Ltd., Chongqing, CN;
Abstract
The present disclosure relates to a method and apparatus for determining an illumination intensity for inspection, and an method and apparatus optical inspection. The method for determining an illumination intensity for inspection comprises: acquiring images of a sample to be inspected taken by each of at least one imaging element at a plurality of illumination intensities; calculating, for each imaging element, a gray standard deviation of each of the images acquired at the plurality of illumination intensities; and determining the illumination intensity of each imaging element for inspection according to the gray standard deviation. The inspection accuracy may be improved by using the illumination intensity determined by the method provided in the present disclosure to inspect an object to be inspected.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile