Hsinchu, Taiwan

Zheng-Hao Zhang

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Taiwan Semiconductor Manufacturing Comp. Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Zheng-Hao Zhang. Retrieved from https://idiyas.com/inventor/zheng-hao-zhang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Innovations by Zheng-Hao Zhang

Introduction

Zheng-Hao Zhang is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of semiconductor technology. His work primarily focuses on reducing particle contamination during the transfer of wafers, which is crucial for maintaining the integrity of semiconductor manufacturing processes.

Latest Patents

Zheng-Hao Zhang holds a patent titled "Apparatuses and Methods for Reducing Particle Contamination of Wafers During Transfer." This innovation addresses a critical challenge in the semiconductor industry, ensuring that wafers remain uncontaminated during handling.

Career Highlights

Zheng-Hao Zhang is associated with Taiwan Semiconductor Manufacturing Company Ltd., a leading player in the semiconductor manufacturing sector. His expertise and innovative solutions contribute to the company's reputation for high-quality production.

Collaborations

Zheng-Hao Zhang collaborates with Hsin Yi Tseng, a fellow professional in the field. Their partnership enhances the development of advanced technologies in semiconductor manufacturing.

Conclusion

Zheng-Hao Zhang's contributions to semiconductor technology through his patent and collaboration with industry professionals highlight his role as an influential inventor. His work continues to impact the efficiency and quality of semiconductor manufacturing processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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