Company Filing History:
Years Active: 2025
Title: Zhen De Ma - Innovator in Wafer Test Pad Technology
Introduction
Zhen De Ma is a prominent inventor based in Taipei, Taiwan. He has made significant contributions to the field of semiconductor technology, particularly in the development of wafer test pads. His innovative approach has led to the creation of a unique redistribution structure that enhances the efficiency of semiconductor testing.
Latest Patents
Zhen De Ma holds a patent for a wafer test pad, which features a redistribution structure. This structure includes a first dielectric layer, a mesh metal feature with a base portion and a frame portion, a second dielectric layer, and a redistribution feature. The design also incorporates a passivation structure and a pad opening that exposes the top surface of the redistribution feature. This innovative approach includes a plurality of contact vias that extend through the second dielectric layer to land on the frame portion of the mesh metal feature. He has 1 patent to his name.
Career Highlights
Zhen De Ma is currently employed at Taiwan Semiconductor Manufacturing Company Limited, a leading firm in the semiconductor industry. His work focuses on advancing technologies that improve the performance and reliability of semiconductor devices. His expertise in wafer test pads has positioned him as a key player in the field.
Collaborations
Zhen De Ma has collaborated with notable colleagues, including Chih-Pin Chiu and Lee-Wen Hsu. These partnerships have fostered innovation and contributed to the development of cutting-edge technologies in the semiconductor sector.
Conclusion
Zhen De Ma's contributions to wafer test pad technology exemplify his commitment to innovation in the semiconductor industry. His work continues to influence advancements in semiconductor testing and manufacturing processes.