This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Asml Netherlands B.v.. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Zhe Wang and Anomaly-Based Defect Inspection
Introduction
Zhe Wang is an inventor based in Dublin, California, whose patent work includes methods for identifying potential defects in samples through image analysis. The supplied information lists him as a man and identifies ASML Netherlands B.V. as his company.
Latest Patents
Wang is associated with 1 patent, titled “Method and System for Anomaly-Based Defect Inspection.” The invention describes receiving two associated images and using clustering techniques to determine feature descriptors for corresponding, co-located pixels. It then calculates mapping probabilities between descriptors and provides an output to help determine whether an abnormal pixel may represent a candidate defect. A candidate defect is identified when a mapping probability does not exceed a specified threshold.
Career Highlights
The patent reflects work on image-based inspection and anomaly detection, with a focus on evaluating corresponding image features to flag potential defects. The supplied information associates Wang with ASML Netherlands B.V.
Collaborations
Wang’s listed coworker is Yani Chen. The supplied information does not specify further details about their collaboration.
Conclusion
Zhe Wang’s listed patent addresses anomaly-based defect inspection by analyzing image features and mapping probabilities to identify candidate defects.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile