Foshan, China

Zhaoming He

This inventor holds 2 USPTO granted patents. Top assignee: Ji Hua Laboratory. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Zhaoming He. Retrieved from https://idiyas.com/inventor/zhaoming-he-d1p3cqct

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 50.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2026

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2 patents (USPTO):Explore Patents

Title: Zhaoming He: Innovator in Defect Detection Technology

Introduction

Zhaoming He is a prominent inventor based in Foshan, China. He has made significant contributions to the field of defect detection technology, particularly in the semiconductor industry. His innovative approach has led to the development of a unique patent that enhances the accuracy of defect identification in wafers.

Latest Patents

Zhaoming He holds a patent for a "Defect detection method, apparatus and device, and computer-readable storage medium." This patent outlines a method that includes acquiring a photoluminescence detection result of a wafer to be detected. It involves generating a defect heat map corresponding to the wafer based on the photoluminescence detection result and a preset heat map model. The preset heat map model is constructed using a photoluminescence detection result sample after electroluminescent defect marking. Ultimately, the method determines a defect detection result of the wafer according to the defect heat map. This innovative approach has the potential to significantly improve defect detection processes in the semiconductor manufacturing sector.

Career Highlights

Zhaoming He is currently associated with Ji Hua Laboratory, where he continues to work on advancing defect detection technologies. His expertise and innovative mindset have positioned him as a key figure in his field. He has demonstrated a commitment to enhancing the efficiency and accuracy of defect detection methods, which is crucial for the semiconductor industry.

Collaborations

Zhaoming He collaborates with talented individuals such as Hai Bi and Jiangwei Duan. These collaborations foster an environment of innovation and creativity, allowing for the exchange of ideas and the development of cutting-edge technologies.

Conclusion

Zhaoming He is a notable inventor whose work in defect detection technology is paving the way for advancements in the semiconductor industry. His patent and ongoing contributions reflect his dedication to innovation and excellence in his field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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