Zeliang Xie

Title: Zeliang Xie: Innovator in GRPC-based Chip Testing

Introduction

Zeliang Xie is a prominent inventor based in Beijing, China. He has made significant contributions to the field of chip testing, particularly through his innovative methods and apparatuses. His work focuses on enhancing the efficiency and effectiveness of chip testing processes.

Latest Patents

Zeliang Xie holds a patent for a GRPC-based chip test method, a GRPC-based chip test apparatus, and a storage medium. The embodiments of this application provide a comprehensive approach to chip testing. The GRPC-based chip test method involves determining the number of chips that need testing and issuing remote instrument call requests accordingly. It also includes acquiring these requests based on the GRPC protocol and sorting them to create a request execution sequence table. This method allows for the sequential testing of chips, optimizing the testing process.

Career Highlights

Throughout his career, Zeliang Xie has worked with notable companies, including Beijing Eswin Computing Technology Co., Ltd. and Guangzhou Transa Semi Information Technology Co., Ltd. His experience in these organizations has contributed to his expertise in chip testing technologies.

Collaborations

Zeliang Xie has collaborated with several professionals in his field, including Ligang Yuan and Zuhua Shi. These collaborations have further enriched his work and innovations in chip testing.

Conclusion

Zeliang Xie is a key figure in the development of GRPC-based chip testing methods and apparatuses. His contributions are paving the way for advancements in the efficiency of chip testing processes.