St. Louis, MO, United States of America

Zekun Li

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Washington University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Zekun Li. Retrieved from https://idiyas.com/inventor/zekun-li-5t12yato

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Zekun Li and Low-Count Quantitative SPECT Imaging

Introduction

Zekun Li is an inventor based in St. Louis, Missouri, and is associated with Washington University. His work includes an invention for low-count quantitative single-photon emission computed tomography (SPECT) imaging.

Latest Patents

Li is credited with 1 patent, titled “Systems and Methods for Low-Count Quantitative Projection Domain SPECT Imaging.” The invention describes a system for low-count quantitative SPECT imaging that stores a subject’s CT scan and defines volumes of interest (VOIs). It models the probability that photons emitted from those volumes will be detected in different projection bins, adjusts the model to account for stray-radiation noise, and uses detected photons from an alpha-particle-emitting isotope to identify their source VOI.

Career Highlights

The patent reflects work at the intersection of medical imaging, computational modeling, and radiation detection. Its approach uses CT-based anatomical information and a noise-adjusted system model to support quantitative imaging when photon counts are low.

Collaborations

Li’s listed coworkers include Abhinav Kumar Jha and Daniel Thorek. The patent’s technical focus connects their work to research in SPECT imaging and quantitative analysis.

Conclusion

Zekun Li’s patent presents a computational approach to low-count SPECT imaging that combines CT-defined volumes, radiation-noise adjustment, and detected-photon data to determine the likely source of emissions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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