The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2026

Filed:

Jul. 13, 2022
Applicant:

Washington University, St. Louis, MO (US);

Inventors:

Abhinav Kumar Jha, St. Louis, MO (US);

Zekun Li, St. Louis, MO (US);

Daniel Thorek, St. Louis, MO (US);

MD Ashequr Rahman, St. Louis, MO (US);

Assignee:

Washington University, St. Louis, MO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01); A61B 6/00 (2024.01); A61B 6/46 (2024.01); G06F 30/25 (2020.01);
U.S. Cl.
CPC ...
A61B 6/032 (2013.01); A61B 6/469 (2013.01); A61B 6/5258 (2013.01); G06F 30/25 (2020.01);
Abstract

A system for low-count quantitative single-photon emission computed tomography (LC-QSPECT) is provided. The system is programmed to a) store a computer tomography (CT) scan of a subject being examining including a plurality of defined volumes of interest (VOIs) of the subject being examined; b) model a system matrix based on the stored CT, wherein the model describes the probability that photons emitted from each of the defined VOIs are detected in different projection bins, wherein a plurality of projection bins are defined around the subject and the defined VOIs; c) adjust the model with analysis of stray-radiation noise around the subject; d) detect, by the one or more sensors, one or more photons being emitted by an alpha-particle-emitting isotope; and e) execute the adjusted model with the one or more detected photons as inputs to determine a source VOI of the detected photons.


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