St. Louis, MO, United States of America

Abhinav Kumar Jha

This inventor holds 3 USPTO granted patents and 4 published patent applications. Top assignee: Washington University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Abhinav Kumar Jha. Retrieved from https://idiyas.com/inventor/abhinav-kumar-jha

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 3 

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2026

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3 patents (USPTO):Explore Patents

Title: Abhinav Kumar Jha: Inventor in Medical Imaging and Deep Learning

Introduction

Abhinav Kumar Jha is an inventor based in St. Louis, Missouri, whose work includes medical imaging and machine-learning methods. He is associated with Washington University and holds 3 patents.

Latest Patents

Jha’s listed patent work includes “Systems and Methods for a Task-Specific Deep-Learning-Based Denoising Approach for Myocardial Perfusion SPECT.” The invention describes a computer system that applies a trained model to medical imaging data to reduce noise while accounting for an observer loss function, then outputs a denoised scan.

Another listed invention, “Carotid Plaque Segmentation Using Trained Neural Network,” describes processing patient images with a multistage trained model. The method segments the images into distinct regions based on plaque components.

Career Highlights

Jha’s patent portfolio reflects applications of trained neural networks and deep learning to medical-image analysis. The described methods address denoising and segmentation, two tasks that can support the interpretation of imaging data.

Collaborations

Jha’s listed coworkers include Md Ashequr Rahman and Zekun Li. His work is associated with Washington University.

Conclusion

Abhinav Kumar Jha’s inventions apply machine-learning techniques to medical imaging, with a focus on denoising scans and segmenting carotid plaque.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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